Home > Packaging Testing Equipment >

ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

Product Categories

Dongguan Zhongli Instrument Technology Co., Ltd.

Trust Seal

Verified Supplier

Credit Check

Supplier Assessment

Contact Now

ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

Brand Name : ZL

Model Number : ZL-1210

Certification : CE,ISO

Place of Origin : China

MOQ : 1 set

Price : Negotiable

Payment Terms : L/C, T/T, Western Union

Supply Ability : 60 Sets

Delivery Time : 5-8 work days

Packaging Details : ISO 4593 Film Thickness Gauge With 0.1 μm Resolution for Paper , Silicon Wafers is packaged within wooden case.

Product name : ISO 4593 Film Thickness Gauge With 0.1 μm Resolution for Paper , Silicon Wafers

Test range : 0～2 mm (conventional) 0～6 mm; 12 mm (optional)

Measuring speed : 10 times/min (adjustable)

Test pressure : 17.5±1 KPa (film); 50±1 KPa (paper)

Sample injection step : 0～1000 mm

Sample injection speed : 0.1～99.9 mm/s

Power supply : AC 220V 50Hz

Net weight : 32 kg

Contact Now

ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper, Silicon Wafers

Overview

The ZL-1210 Thickness Gauge employs mechanical contact measurement methodology, strictly adhering to standard requirements to ensure testing standardization and accuracy. This professional instrument is designed for precise thickness measurement of various materials including plastic films, sheets, diaphragms, paper, foils, silicon wafers, and more within the specified measuring range.

Key Features

Strictly designed contact area and measured pressure compliant with standards, with support for various non-standard customizations
Automatically raised and lowered measuring head during testing to eliminate human-induced system errors
Dual automatic and manual measurement modes for flexible user operation
Automatic sample injection with user-configurable parameters including sampling step, measuring points, and sampling speed
Real-time display of analytical data including maximum, minimum, average, and standard deviation measurements
Equipped with standard gauge blocks for system calibration to ensure test accuracy and data consistency
Comprehensive functionality including real-time data display, automatic statistics, and printing capabilities
Microcomputer-controlled system with LCD display, menu interface, and PVC operation panel for intuitive operation
Standard USB interface for external computer connectivity and data transfer

Applications

Basic Applications
Sheets, diaphragms, paper, cardboard, foil, silicon wafers, metal sheets, textile materials, solid electrical insulators, non-woven fabric materials, and products such as diapers and sanitary napkin sheets

Testing Principle

The ZL-1210 film thickness measuring instrument utilizes mechanical contact measurement principles. A specific pattern size is intercepted, and through control panel buttons, the measuring head is adjusted to contact the pattern. The pressure generated between the two contact surfaces and the measured values from the two contact areas are processed by the sensor to determine material thickness.

Compliance Standards

This instrument complies with numerous national and international standards: ISO 4593, ISO 534, ISO 3034, GB/T 6672, GB/T 451.3, GB/T 6547, ASTM D374, ASTM D1777, TAPPI T411, JIS K6250, JIS K6783, JIS Z1702, BS 3983, BS 4817

Technical Specifications

Parameter	Specification
Model	ZL-1210 Film Thickness Gauge
Test Range	0-2 mm (conventional); 0-6 mm; 12 mm (optional)
Resolution	0.1 μm
Measuring Speed	10 times/min (adjustable)
Test Pressure	17.5±1 KPa (film); 50±1 KPa (paper)
Contact Area	50 mm² (film); 200 mm² (paper) Note: Choose film or paper configuration; non-standard customizations available
Sample Injection Step	0-1000 mm
Sample Injection Speed	0.1-99.9 mm/s
Power Supply	AC 220V 50Hz
Dimensions	461 mm(L) × 334 mm(W) × 357 mm(H)
Net Weight	32 kg

Standard Configuration

Component	Description
Standard Configuration	Host unit, one standard gauge block, communication cable, measuring head
Optional Parts	Non-standard measuring head, counterweight, professional software

ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers

Product Tags:

ISO 4593 Packaging Testing Equipment

99.9 mm/s Packaging Testing machine

ISO 4593 Film Thickness Gauge With 0.1 μM Resolution For Paper , Silicon Wafers Images

Inquiry Cart 0

Send your message to this supplier


*From:	Your email address is incorrect!
*To:	Dongguan Zhongli Instrument Technology Co., Ltd.
*Subject:	Subject is empty!
*Message:	For the best results, we recommend including the following details: -Self introduction -Required specifications -Inquire about price/MOQ Characters Remaining: (0/3000) Please enter 20 to 3000 characters to contact this supplier!